- integrated circuit test set
- Техника: установка для испытаний интегральных схем
Универсальный англо-русский словарь. Академик.ру. 2011.
integrated circuit test set
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Integrated circuit design — Layout view of a simple CMOS Operational Amplifier ( inputs are to the left and the compensation capacitor is to the right ). The metal layers are colored blue and green, the polysilicon is red and vias are crosses. Integrated circuit design, or… … Wikipedia
Application-specific integrated circuit — An application specific integrated circuit (ASIC) is an integrated circuit (IC) customized for a particular use, rather than intended for general purpose use. For example, a chip designed solely to run a cell phone is an ASIC.In contrast, the… … Wikipedia
Test probe — Typical passive oscilloscope probe being used for testing an integrated circuit. A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to the device under test (DUT). They range from… … Wikipedia
Circuit design — The process of circuit design can cover systems ranging from complex electronic systems all the way down to the individual transistors within an integrated circuit. For simple circuits the design process can often be done by one person without… … Wikipedia
Integrated Truss Structure — ISS elements as of February 2010[update] … Wikipedia
Printed circuit board — Part of a 1983 Sinclair ZX Spectrum computer board; a populated PCB, showing the conductive traces, vias (the through hole paths to the other surface), and some mounted electrical components A printed circuit board, or PCB, is used to… … Wikipedia
Joint Test Action Group — (JTAG) is the usual name used for the IEEE 1149.1 standard entitled Standard Test Access Port and Boundary Scan Architecture for test access ports used for testing printed circuit boards using boundary scan.JTAG was an industry group formed in… … Wikipedia
Built-in self-test — A built in self test (BIST)mechanism within an integrated circuit (IC) is a function that verifies all or a portion of the internal functionality of the IC. For example, a BIST mechanism is provided in advanced fieldbus systems to verify… … Wikipedia
Automatic test pattern generation — ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables testers… … Wikipedia
Closed-circuit television — CCTV redirects here. For other uses, see CCTV (disambiguation). For the Chinese television station, see China Central Television. Surveillance cameras on a corner. Closed circuit television (CCTV) is the use of video cameras to transmit a signal… … Wikipedia
Design For Test — (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply… … Wikipedia
